Josephson current through a ferromagnetic semiconductor/semiconductor/ferromagnetic semiconductor structure |
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Authors: | Y. C. Tao |
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Affiliation: | (1) Department of Physics, Nanjing Normal University, Nanjing, 210097, P.R. China |
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Abstract: | ![]() We theoretically calculate the Josephson current for two superconductor/ferromagnetic semiconductor (SC/FS) bilayers separated by a semiconductor (SM) layer. It is found that the critical Josephson current IC in the junction is strongly determined by not only the relative orientations of the effective exchange field of the two bilayers and scattering potential strengths at the interfaces but also the kinds of holes (the heavy or light) in the two FS layers. Furthermore, a robust approach to measuring the spin polarization P for the heavy and light holes is presented. |
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Keywords: | 74.50.+r Tunneling phenomena point contacts, weak links, Josephson effects 74.45.+c Proximity effects Andreev effect SN and SNS junctions 75.50.Pp Magnetic semiconductors |
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