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Exploring background variability of a low-level (quartz) gas proportional counter using pulse shape and distribution analysis
Authors:George A. Klouda  James J. Filliben
Affiliation:1. Material Measurement Laboratory, Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899-8371, USA
2. Information Technology Laboratory, Statistical Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899-8371, USA
Abstract:
The NIST low-level beta counting system is designed to capture digitally and timestamp each event for retrospective analysis. As a result, low and stable backgrounds are achieved and lead to extremely low detection and quantification limits for measuring, e.g., 14C of atmospheric gases and aerosol. The objective here is to explore the variability of the background count rate (counts per day) of several small (1 mL) freshly-assembled gas proportional counters (GPCs). The mean is 14.0 day?1 with 95 % confidence limits 11.2–16.8 day?1. The raw count per day data was non-normal and so a Log transformation was applied to achieve normality and to rigorously compute normal tolerance limits. Back in the original space such (95 % confidence, 95 % coverage) tolerance limits were 2.5–47.8 day?1. These limits are taken as acceptance criteria for any GPCs assembled in the future.
Keywords:
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