Measurement of the thickness of thin polymer layers by infrared frustrated total internal reflection spectroscopy |
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Authors: | N A Nikonenko O N Tretinnikov |
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Institution: | (1) B. I. Stepanov Institute of Physics, National Academy of Sciences of Belarus, 68 Prospekt Nezavsimosti, Minsk, 220072, Belarus |
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Abstract: | A method is proposed for determining the thickness of thin (0.1–5.0 μm) polymer layers and coatings by means of infrared frustrated
total internal reflection (FTIR) spectroscopy. This method is based on an analytic expression derived for the dependence of
the intensities of absorption bands in IR FTIR spectra on the thickness of a polymer layer. The method is tested on model
samples consisting of a thick film of polyethylene terephthalate with a layer of different thicknesses of polystyrene deposited
on it. The advantage of this method is the ability to determine the thickness of thin polymer layers deposited on bulk or
opaque polymer substrates.
Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 75, No. 6, pp. 881–885, November–December, 2008. |
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Keywords: | polymer materials thin films infrared spectroscopy frustrated total internal reflection |
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