| 晶体双折射测量的干涉条纹重迭法 |
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| 引用本文： | 廖兆曙,陶景光,杨坤涛. 晶体双折射测量的干涉条纹重迭法[J]. 光学技术, 1994, 0(1) |
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| 作者姓名： | 廖兆曙 陶景光 杨坤涛 |
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| 作者单位： | 武汉华中理工大学 |
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| 摘 要： | 本文介绍用干涉条纹的重迭与否测量晶体双折射。作者用干涉条纹取代光栅的Ｔａｌｂｏｔ像，主要优点是条纹的对比度好。
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| 关 键 词： | 莫尔条纹，泰伯像，干涉条纹，重迭 |
Birefringence measurements using overlapping of interference fringes |
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| Liao Zhaoshu Tao Jingguang Yang Kuntao. Birefringence measurements using overlapping of interference fringes[J]. Optical Technique, 1994, 0(1) |
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| Authors: | Liao Zhaoshu Tao Jingguang Yang Kuntao |
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| Affiliation: | Liao Zhaoshu Tao Jingguang Yang Kuntao |
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| Abstract: | n this paper we described how measure brifringence using overlapping of interferencefringes. We replaced Talbot image of a grating by interference fringes,its advantage is the Moire fringes contrast is better. |
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| Keywords: | Moire fringes Talbot image interference fringes overlap |
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