Surface morphology,structural and optical properties of polar and non-polar ZnO thin films: A comparative study |
| |
| Authors: | R. Deng B. Yao Y.F. Li B.H. Li Z.Z. Zhang H.F. Zhao J.Y. Zhang D.X. Zhao D.Z. Shen X.W. Fan L.L. Yang Q.X. Zhao |
| |
| Affiliation: | 1. Department of Physics, Jilin University, Changchun 130023, People''s Republic of China;2. Key Laboratory of Excited State Processes, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, People''s Republic of China;3. Department of Science and Technology (ITN), Linkoping University, Sweden |
| |
| Abstract: | The polar and non-polar ZnO thin films were fabricated on cubic MgO (1 1 1) and (0 0 1) substrates by plasma-assisted molecular beam epitaxy. Based on X-ray diffraction analysis, the ZnO thin films grown on MgO (1 1 1) and (1 0 0) substrates exhibit the polar c-plane and non-polar m-plane orientation, respectively. Comparing with the c-plane ZnO film, the non-polar m-plane ZnO film shows cross-hatched stripes-like morphology, lower surface roughness and slower growth rate. However, low-temperature photoluminescence measurement indicates the m-plane ZnO film has a stronger 3.31 eV emission, which is considered to be related to stacking faults. Meanwhile, stronger band tails absorbance of the m-plane ZnO film is observed in optical absorption spectrum. |
| |
| Keywords: | 81.15.Hi 78.55.Et 78.66.Hf |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
