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Experimental method for the extraction of intensity profiles by imaging the scattered pattern with a charge-coupled device
Authors:Haixia Li Meina Zhang Kiaoyi Chen Chunxiang Liu and Chuanfu Cheng
Institution:[1]Department of Information Science and Technology, Shandong University of Politics Science and Law, Jinan 250014, China [2]College of Physics and Electronics, Shandong Normal University, Jinan 250014, China
Abstract:
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