| Abstract: | Uniform and high phosphorous doping has been demonstrated during Si growth by GSMBE using disilane and phosphine. The p–n diodes, which consist of a n-Si layer and a p-SiGe layer grown on Si substrate, show a normal I–V characteristic. A roughening transition during P-doped Si growth is found. Ex situ SEM results show that thinner film is specular. When the film becomes thicker, there are small pits of different sizes randomly distributed on the flat surface. The average pit size increases, the pit density decreases, and the size distribution is narrower for even thicker film. No extended defects are found at the substrate interface or in the epilayer. Possible causes for the morphological evolution are discussed. |
