| 电感耦合等离子体原子发射光谱法测定镍基钎料中Cr,Si,B,Fe |
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| 引用本文： | 李佗,杨军红,翟通德.电感耦合等离子体原子发射光谱法测定镍基钎料中Cr,Si,B,Fe[J].化学分析计量,2014(4):51-53. |
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| 作者姓名： | 李佗 杨军红 翟通德 |
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| 作者单位： | 西部金属材料股份有限公司理化检验中心,陕西宝鸡721014 |
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| 摘 要： | 建立了电感耦合等离子体原子发射光谱法测定镍基钎料中Cr,Si,B,Fe含量的新方法。以硝酸–氢氟酸溶解样品,分别选择267.716,288.158,249.677,259.940 nm作为分析谱线,不用进行基体匹配,可直接测定镍基钎料中Cr,Si,B,Fe含量。在优化的实验条件下,测定结果的相对标准偏差为0.71%~1.43%(n=11),加标回收率为97.0%~102.0%。该方法可满足日常分析对镍基钎料中Cr,Si,B,Fe含量的检测要求。
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| 关 键 词： | 电感耦合等离子体原子发射光谱法 镍基钎料 Cr Si B Fe |
Determination of Cr,Si, B,Fe in Nickel-Base Brazing Material by ICP-AES |
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| Li Tuo,Yang Junhong,Zhai Tongde.Determination of Cr,Si, B,Fe in Nickel-Base Brazing Material by ICP-AES[J].Chemical Analysis And Meterage,2014(4):51-53. |
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| Authors: | Li Tuo Yang Junhong Zhai Tongde |
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| Institution: | (Physics ＆ Chemistry Inspection Center for Western Metal Materials Co. Ltd., Baoji 721014, China) |
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| Abstract: | A new method was set up for the determination of Cr, Si, B, Fe in nickel-base brazing material by ICP–AES. The determination conditions such as the sample pre-treatment method, the matrix and the analytical lines were dis-cussed. The sample was dissolved in nitric acid-hydrofluoric acid, 267.716, 288.158, 249.677, 259.940 nm were selected as the analytical spectral lines for Cr, Si, B, Fe, respectively. It was showed that under the optimal conditions the results were satisfactory with RSD （n=11） less than 2.0%and the recoveries tested were in the range of 97.0%–102.0%. The method has good sensitivity, low detection limit,and it is feasible in the determination of Cr, Si, B, Fe in nickel-base brazing material. |
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| Keywords: | ICP-AES nickel-base brazing material Cr Si B Fe |
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