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Effect of residual stress on the optical properties of CsCl thin films |
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| Authors: | Kuldeep Kumar Chhaya Ravi Kant L. Makinistian E.A. Albanesi |
| Affiliation: | a Department of Physics and Electronics, S.G.T.B. Khalsa College, University of Delhi, Delhi 110 007, India b Department of Applied Sciences, Indira Gandhi Institute of Technology, Guru Gobind Singh Indraprastha University, Delhi 110 006, India c University Science and Instrumentation Center, University of Delhi, Delhi 110 007, India d Facultad de Ingeniería, Universidad Nacional de Entre Ríos, 3101 Oro Verde (ER), Argentina e Grupo de Materiales Computacionales, INTEC-CONICET, Guemes 3450, 3000 Sante Fe, Argentina |
| Abstract: | |
| Keywords: | A. Thin films C. X-ray diffraction |
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