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Theory of modified thermally stimulated current and direct determination of trap level distribution
Authors:Fuqiang Tian  Wenbin Bu  Linshuang Shi  Chun Yang  Yi Wang  Qingquan Lei
Affiliation:1. School of Electrical Engineering, Beijing Jiaotong University, Beijing 100044, China;2. School of Applied sciences, Harbin University of Science and Technology, Harbin 150080, China;3. College of Electrical and Electronic Engineering, Harbin University of Science and Technology, Harbin 150040, China;4. School of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China;5. Key Laboratory of Engineering Dielectric and its Application, Ministry of Education, Harbin University of Science and Technology, Harbin 150040, China
Abstract:In order to investigate the trap level distribution in polymer films, a new method is proposed based on modified thermally stimulated current (TSC) theory and numerical calculation of the TSC measurement. In this method, a new function is defined to weight the contribution of every trap level to the external current. The demarcation energy is used to study the trap emptying process. The modified TSC theory shows that only the electrons with trap levels very close to the demarcation energy can significantly contribute to the external circuit at any instant temperature. Based on this method, the trap level distribution of the DuPont original polyimide film 100HN and nanocomposite polyimide film 100CR are investigated as an application example. The effectiveness of the method is confirmed by the experiments. The experimental results show that the trap level density in the 100CR PI films is about six times larger than that in the 100HN PI films through the investigated trap level ranges 06–1.3 eV. The increased traps in 100CR should be introduced by nanofillers, probably come from the interfaces formed between nanofillers and the polymer matrix.
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