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Comparison of intrinsic zero-energy loss and Shirley-type background corrected profiles of XPS spectra for quantitative surface analysis: Study of Cr, Mn and Fe oxides
Authors:Masaoki Oku   Shigeru Suzuki   Naofumi Ohtsu   Toetsu Shishido  Kazuaki Wagatsuma
Affiliation:

aInstitute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, 980-0751, Japan

bInstitute for Material Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, 980-0751, Japan

Abstract:
The intrinsic zero-energy loss profiles of transition metal 2p and 3p XPS spectra for Cr, Mn, and Fe oxides are obtained by spectral deconvolution and compared with Shirley-type background corrected profiles. The metal core level spectra are deconvoluted by O 1s spectra as the response function of each oxide. As the O 1s spectra include intrinsic and extrinsic energy loss parts, the background corrected core level spectra are zero-energy loss spectra. The good agreement of the deconvoluted spectra with the reported spectra obtained by the many body effect theory indicates that the background subtraction method is accurate. A comparison of the deconvoluted with the background corrected spectra of the Shirely-type subtraction reveals that almost all the spectra coincide with each other except for Fe 3p with -Fe2O3. The good coincidence of the Shirley-type corrected spectra with the deconvoluted and calculated spectra indicates that Shirley-type background correction can be used for daily quantitative surface analysis.
Keywords:XPS   Core levels   Intrinsic zero-energy loss profiles   Background correction   Shirley-type   Cr   Mn   Fe   Oxides
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