Model of silicon carbide formation on porous substrates

The formation of thin silicon carbide layers as a result of solid-phase processes is related to the evolution of nanoscale porosity and chemical reactions on pore surfaces. Numerical experiments, which simulate blistering under the action of Xe+ ions in the metal-insulator (Mo/Si) bilayer make it possible to establish the relationship between the porosity parameters and layer stresses and the irradiation conditions. Similar patterns in the formation of defects (pores and cracks) in crystalline silicon characterize its interaction with carbon dioxide when silicon carbide is formed. The calculated characteristics of the nucleation in the Mo/Si bilayers are analyzed to optimize the solid-phase epitaxy of silicon carbide.