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The determination of the refractive index and the thickness of thin films of aluminium oxide on aluminium by the polarimetric method
Authors:Antonín Va?í?ek
Institution:(1) Institute of Physics, Masaryk University, Brno
Abstract:Formulas for the reflection of light from glass (i. e. a dielectric) coated with a thin non-metallic film are generalized for the case of the reflection of light from a metal coated with a thin non-metallic film, e. g. a film of aluminium oxide on aluminium. It is shown how the refractive index and the thickness of the aluminium oxide film on an aluminium mirror can be determined by measurements in polarized light. In conclusion the results of Drude's classical theory of thin non-metallic films on metallic mirrors are compared with the results obtained by the author on the basis of the interference of light in thin films.
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