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Scanning probe microscopy study of exfoliated oxidized graphene sheets |
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| Authors: | D Pandey R Reifenberger R Piner |
| Institution: | aDepartment of Physics, Purdue University, West Lafayette, IN 47907, United States bBrick Nanotechnology Center, Purdue University, West Lafayette, IN 47907, United States cDepartment of Mechanical Engineering, The University of Texas at Austin, Austin, TX 78712-0292, United States |
| Abstract: | Exfoliated oxidized graphene (OG) sheets, suspended in an aqueous solution, were deposited on freshly cleaved HOPG and studied by ambient AFM and UHV STM. The AFM images revealed oxidized graphene sheets with a lateral dimension of  5–10 μm. The oxidized graphene sheets exhibited different thicknesses and were found to conformally coat the HOPG substrate. Wrinkles and folds induced by the deposition process were clearly observed. Phase imaging and lateral force microscopy showed distinct contrast between the oxidized graphene and the underlying HOPG substrate. The UHV STM studies of oxidized graphene revealed atomic scale periodicity showing a (0.273 ± 0.008) nm × (0.406 ± 0.013) nm unit cell over distances spanning few nanometers. This periodicity is identified with oxygen atoms bound to the oxidized graphene sheet. I(V) data were taken from oxidized graphene sheets and compared to similar data obtained from bulk HOPG. The dI/dV data from oxidized graphene reveals a reduction in the local density of states for bias voltages in the range of ±0.1 V. |
| Keywords: | Atomic force microscopy Lateral force microscopy Scanning tunneling microscopy Scanning tunneling spectroscopy Highly oriented pyrolitic graphite Oxidized graphene (OG) |
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