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Domain wall velocity measurement in permalloy nanowires with X-ray magnetic circular dichroism imaging and single shot Kerr microscopy
Authors:T.A. Moore  M. Kl?ui  L. Heyne  P. M?hrke  D. Backes  J. Rhensius  U. Rüdiger  L.J. Heyderman  T.O. Mentes  M.á. Ni?o  A. Locatelli  A. Potenza  H. Marchetto  S. Cavill  S.S. Dhesi
Affiliation:1. Fachbereich Physik, Universität Konstanz, Universitätsstrasse 10, 78457 Konstanz, Germany;2. Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen PSI, Switzerland;3. Sincrotrone Trieste, 34012 Basovizza-Trieste, Italy;4. Diamond Light Source Ltd., Harwell Science and Innovation Campus, Didcot, Oxfordshire, OX11 0DE, UK;1. Centro de Desenvolvimento da Tecnologia Nuclear, CDTN, 31270-901 Belo Horizonte, MG, Brazil;2. Departamento de Física, Universidade Federal de Minas Gerais, 31270-901 Belo Horizonte, Brazil;1. Christian Doppler Laboratory for Nonvolatile Magnetoresistive Memory and Logic at the Institute for Microelectronics, TU Wien, Vienna, Austria;2. Institute for Microelectronics, TU Wien, Gußhausstraße 27-29/E360, 1040 Vienna, Austria;3. Silvaco Europe Ltd., Cambridge, United Kingdom;1. Department of Physics and Research Institute of Basic Science, Kyung Hee University, Seoul 02447, Republic of Korea;2. School of Physics, Korea Institute for Advanced Study, Seoul 02445, Republic of Korea;3. Theoretical Physics Department, CERN, CH-1211 Geneva 23, Switzerland
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