Characterization of heat-assisted magnetic probe recording on CoNi/Pt multilayers |
| |
| Authors: | Li Zhang James A. Bain Jian-Gang Zhu Leon Abelmann Takahiro Onoue |
| |
| Affiliation: | 1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054, PR China;2. Data Storage Systems Center, Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA;3. Systems and Materials for Information storage group, MESA+ Research Institute, P.O. Box 217 7500 AE Enschede, The Netherlands |
| |
| Abstract: | A method of heat-assisted magnetic recording (HAMR) potentially suitable for probe-based storage systems is characterized. In this work, field emission current from a scanning tunneling microscope (STM) tip is used as the heating source. Pulse voltages of 2–7 V were applied to a CoNi/Pt multilayered film fabricated on either bare silicon or oxidized silicon substrates. Different types of Ir/Pt and W STM tips were used in the experiment. The results show that thermally recorded magnetic marks are formed with a nearly uniform mark size of 170 nm on the film fabricated on bare silicon substrate when the pulse voltage is above a threshold voltage. The mark size becomes 260 nm when they are written on the identical film fabricated on an oxidized silicon substrate. The threshold voltage depends on the material work function of the tip, with W having a threshold voltage about 1 V lower than Pt. A synthesized model, which contains the calculation of the emission current, the simulation of heat transfer during heating, and the study of magnetic domain formation, was introduced to explain experimental results. The simulation agrees well with the experiments. |
| |
| Keywords: | High-density perpendicular recording Heat-assisted magnetic recording (HAMR) Scanning tunneling microscope Probe recording |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
