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Coexistence of positive and negative exchange bias in CrMn/Co bilayers |
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| Authors: | Nguyen Nguyen Phuoc Nguyen Phu Thuy Nguyen Anh Tuan Le Thanh Hung Nguyen Trung Thanh Nguyen Thanh Nam |
| Affiliation: | 1. International Training Institute for Materials Science, Hanoi University of Technology, Hanoi, Vietnam;2. Information Storage Materials Laboratory, Toyota Technological Institute, Nagoya, Japan;3. College of Technology, Vietnam National University, Hanoi, Vietnam |
| Abstract: | Exchange-biased CrMn/Co bilayers with various thicknesses of Co sputtered onto Si(1 0 0) substrates by the RF sputtering system have been studied. Double-shifted loops have been observed with the thickness of Co layer in a narrow range and become single-shifted loops after some cycles of measurement. Those results are interpreted as the association of positive and negative exchange bias. |
| Keywords: | 75.70.Cn 75.70.&minus i 75.25.+z 75.30.Gw |
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