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Angular and NiFe thickness dependence of exchange bias in IrMn/NiFe/IrMn thin film |
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| Authors: | Yong-Goo Yoo Seong-Gi Min Ho-Jun Ryu Nam-Seok Park Seong-Cho Yu |
| Institution: | 1. Electronics and Telecommunications Research Institute, Daejeon 305-350, South Korea;2. Department of Physics, Chungbuk National University, Cheongju 360-763, South Korea;3. Department of Electrical and Electronic engineering, Chungju National University, Chungju 380-702, South Korea |
| Abstract: | Exchange biased IrMn/NiFe/IrMn thin films were studied as a function of NiFe thickness. In plane angular dependence of a resonance field distribution which is measured by FMR was analyzed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. The unidirectional anisotropic field and the uniaxial anisotropic field were linearly varied with NiFe thickness while the films with a thicker NiFe layer do not follow the linear variation. Resonance field and linewidth variations were also analysed with NiFe thickness. |
| Keywords: | 75 70 Cn 68 55 &minus a |
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