The determination of the lamellar thickness in semi-crystalline polymers by small-angle scattering

Three small-angle scattering methods for determining the thickness of the crystalline lamellae in polymers are described. These are based on 1. observation of the identity period, 2. determination of the specific surface of the phase boundary, and 3. analysis of the shape of the peak at the origin. The conditions for application of these methods and the types of average obtained are discussed, and some results are presented.