Calculations of the Mueller matrix for scattering of light from two-dimensional surfaces

Abstract

Results are presented of an analysis of the Mueller matrix parameters for the problem of scattering of light from two-dimensional rough surfaces. The Mueller matrix fully describes the polarization properties of the scattered light. It is shown, using symmetry arguments, that for normal incidence it is necessary to measure the Mueller matrix terms in only one plane, thus reducing the amount of data to be analysed. Examples of the form of the Mueller matrix terms are calculated using a simple ray-trace approach.