低速Xe~(q+)(4≤q≤20)离子与Ni表面碰撞中的光辐射

实验中测量了0.38V_(Bohr)(460 keV)高电荷态Xe~(q+)(4≤q≤20)离子轰击高纯Ni表面发射的400-510 nm光谱.实验结果包括NiⅠ原子谱线,NiⅡ离子谱线,以及入射离子中性化发射的XeⅠ,XeⅡ和XeⅢ谱线.研究了谱线XeⅡ410.419,XeⅢ430.444,XeⅡ434.200,XeⅡ486.254,NiⅠ498.245,NiⅠ501.697,NiⅠ503.502,NiⅠ505.061和NiⅠ508.293 nm的光子产额随着入射离子电荷态的变化.结果表明,入射离子中性化和溅射Ni原子发射谱线的光子产额随着入射离子电荷态的增加而增加,其趋势与入射离子势能一致.

Visible light emission from surface of nickel bombarded by slow Xeq+ (4 ≤ q ≤ 20) ion

Bombarded by slow highly charged ion (SHCI), particles including ions and atoms of metal are excited and ejected from the sample. Optical emission can be observed for the radiative de-excitation of some excited atomic particles. The important information about particle ejection and incident ion neutralization, as well as the nature, the kinetic energy, and the number of the sputtered excited particles can be obtained by studying the optical emission process. The optical emission from the the collisions between slow (V~0.38 V_Bohr) highly charged Xe^q+ (4 ≤ q ≤ 20) ions and high purity Ni (99.995%) surface is studied. The experiment is carried out at the 320 kV for multi-discipline research with HCIs in the Institute of Modern Physics, Chinese Academy of Sciences. The spectral lines are analyzed by using an Sp-2558 spectrometer equipped with a pattern of 1200 groves/mm blazed at 500 nm and an R955 photomultiplier tube at the exit slit. The target beam current corresponding to the dwell time is recorded, which can be translated into the incident ion current. Based on the formula of Y_λ=N_λ/(_t/C×e×q), the spectral line intensity is normalized. The normalized spectrum can be obtained from the interaction of 0.38V_Bohr Xe²⁰⁺ ions with Ni surface in a wavelength range of 400-510 nm. The species at excited state can be identified by comparing the wavelengths of spectral lines with those in the standard spectroscopic table. Most of the observed spectral lines are identified as being from the electron transitions of Ni I 3d⁹(²D)4p-3d⁹(²D_5/2)4d, Ni I 3d⁸(³F)4s4p(³P°)-3d⁸4s(⁴F)5s and Ni Ⅱ 3p⁶3d⁹-3p⁶3d⁸(³P)4s, as well as Xe I 5p⁵(²P°_3/2)6s-5p⁵(²P°_3/2)8p, Xe Ⅱ 5p⁴(³P₂)6p-5p⁴(³P₂)6d and Xe Ⅲ 5s²5p³(²D)6s-5s²5p³(²D)6p. Compared with the single charged ion, some neutralized incident ions yield Xe I, Xe Ⅱ, Xe Ⅲ spectral lines. The photon yields of spectral lines, such as Xe Ⅱ 410.419, Xe Ⅲ 430.444, Xe Ⅱ 434.200, Xe Ⅱ 486.254, Ni I 498.245, Ni I 501.697, Ni I 503.502, Ni I 505.061 and Ni I 508.293 nm, are presented each as a function of charge state of incident ion. The results show that the photon yield increases with the increase of the charge state, which is consistent with the potential energy of the incident ion. The potential energy is the driving force for photon emission of excited Ni atom. The neutralization of Xe^q+ is in good agreement with that indicated by the classical over-the-barrier model.