| X光底片在位相对标定 |
| |
| 引用本文： | 蔡玉琴,杨上金.X光底片在位相对标定[J].强激光与粒子束,1991,3(1):121-125. |
| |
| 作者姓名： | 蔡玉琴 杨上金 |
| |
| 作者单位： | 西南核物理与化学研究所
(蔡玉琴，杨上金)，西南核物理与化学研究所(张启仁) |
| |
| 摘 要： | 本文描述了X光底片在位相对标定技术。其原理是使X射线谱经阶梯形吸收滤片透射后,对X光底片曝光,测量底片的曝光量。文中给出了标定方法和数据处理方法,而且也给出了在X光激光实验中得到的Kodak AA5底片的特性曲线。
|
| 关 键 词： | X光底片 在位相对标定 |
AN IN-SITU RELATIVE CALIBRATION FOR X-RAY FILM |
| |
| Cai Yuqin,Yang Shangjin,and Zhang Qiren Southwest Institute of Nuclear Physics and Chemistry.AN IN-SITU RELATIVE CALIBRATION FOR X-RAY FILM[J].High Power Laser and Particle Beams,1991,3(1):121-125. |
| |
| Authors: | Cai Yuqin Yang Shangjin and Zhang Qiren Southwest Institute of Nuclear Physics and Chemistry |
| |
| Abstract: | An in-situ relative calibration technique for X-ray film is described in this paper. The technique is based on film exposure measurements which is irradiated by x-rays transmitted through a stepwedge absorption filter. The calibration method and the treatment method of data are given. Also, we present a characteristic curve for Kodak AA5 film obtained in an X-ray laser experiment. |
| |
| Keywords: | in-situ relative calibration stepwedge filter |
| 本文献已被 CNKI 维普 等数据库收录！ |
