| Readout of super-resolution marks with Ti thin film |
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| 作者姓名： | 魏劲松 王阳 徐文东 孙真荣 张峰 周飞 干福熹 |
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| 作者单位： | Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，East China Normal University，Shanghai 200062，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800，Shanghai Institute of Optics and Fine Mechanics，Chinese Academy of Sciences，Shanghai 201800 |
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| 基金项目： | This work is financially supported by the National Natural Science Foundation of China (No. 60207005)，the National 863 Project of China (No. 2002AA313030)，the National Research Fund for Fundamental Key Project 973 (No. 19990330). |
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| 摘 要： | Using Ti as the super-resolution reflective film to replace the Al reflective layer in conventional read-only optical disk, the recording marks with a diameter of 380 nm and a depth of 50 nm are read out in a dynamic testing device whose laser wavelength is 632.8 nm and numerical aperture of the lens is 0.40. The optimum Ti thin film thickness is 18 nm and the corresponding signal-noise-ratio is 32 dB.
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Readout of super-resolution marks with Ti thin film |
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| Abstract: | Using Ti as the super-resolution reflective film to replace the A1 reflective layer in conventional read-onlyoptical disk, the recording marks with a diameter of 380 nm and a depth of 50 nm are read out in adynamic testing device whose laser wavelength is 632.8 nm and numerical aperture of the lens is 0.40. Theoptimum Ti thin film thickness is 18 nm and the corresponding signal-noise-ratio is 32 dB. |
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