Structural and ferromagnetic properties of epitaxial SrRuO3 thin films obtained by polymer-assisted deposition |
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Authors: | Luo H M Jain M Baily S A McCleskey T M Burrell A K Bauer E DePaula R F Dowden P C Civale L Jia Q X |
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Affiliation: | Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. hluo@lanl.gov |
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Abstract: | Epitaxial ferromagnetic SrRuO3 thin films with a room-temperature resistivity of 300 microOmega.cm have been successfully grown on LaAlO3(001) substrates at a processing temperature in the range of 550-750 degrees C by a polymer-assisted deposition technique. X-ray diffraction analysis shows good epitaxial quality of SrRuO3 thin films, giving values of the full width at half-maximum (FWHM) of 0.42 degrees from the rocking curve for the (002) reflection and 1.1 degrees from the in-plane phi scan for the (204) reflection. Both the resistivity and the magnetization versus temperature measurements show that the SrRuO3 films are ferromagnetic with a transition temperature of 160 K. The spontaneous magnetization near the ferromagnetic transition follows the scaling law, and the low-temperature magnetization follows the Bloch law. |
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