On the theory of X-ray coherent reflection from a rough surface |
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Authors: | S V Salikhov F N Chukhovskii A M Polyakov |
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Institution: | (1) School of Science, Center for Teraheriz Research, Rensselaer polytechnic lnstitute, 110 8th Street, 12180 Troy, NY, USA;(2) IMRA America, Inc., 1044 Woodridge Avenue, 48105 Ann Arbor, MI, USA |
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Abstract: | A solution of the problem of X-ray specular reflection from a statistically rough surface is presented. It is based on using
the Green function formalism. The Kirchhoff formula is used to describe the transmission of the wave field through a rough
interface. Generally, microscopically exact expressions for the coefficients of transmission through a rough surface and reflection
from it are obtained by taking multiple scattering effects into account. Averaging of the obtained expressions over possible
realizations of random roughness of the interface between media allows to obtain rigorous expressions for specular reflection
and transmission coefficients. The behavior of exact solutions in the limiting case of infinite correlation lengths is studied.
It is shown that, in this case, the obtained solution corresponds to the Debye-Waller normalization. Expressions for the reflection
and transmission coefficients making it possible to carry out numerical calculations are obtained in the Bourret approximation
of multiple-scattering theory. |
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Keywords: | |
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