| 六偏磷酸钠溶液处理硫酸钙矿石所生成膜层的剖面分析 |
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| 引用本文： | 郭志琴,刘履华.六偏磷酸钠溶液处理硫酸钙矿石所生成膜层的剖面分析[J].光谱实验室,1994,11(5):3-6. |
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| 作者姓名： | 郭志琴 刘履华 |
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| 作者单位： | 成都科技大学化工系，中国科学院成都分院分析测试中心，成都市磨子桥 |
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| 摘 要： | 本文用变角ＸＰＳ对用不同浓度的六偏磷酸钠水溶液处理后的硫酸钙矿石反应层进行了剖面分析研究。研究结果发现：反应层集中在矿石表面以下０─１０．０ｎｍ范围内，整个反应层内组成基本相同，而且在４．０─７．０ｎｍ范围内硫与磷的相对原子百分比变化不大。
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| 关 键 词： | X射线光电子能谱，剖面，膜。 |
Investigation of Depth Profiles of the Film on the Surface of Calcium Sulphate Ore Soaked by Aqueous (NaPO_3)_6 Solution |
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| Guo Zhiqin, Chen Yinsxiang.Investigation of Depth Profiles of the Film on the Surface of Calcium Sulphate Ore Soaked by Aqueous (NaPO_3)_6 Solution[J].Chinese Journal of Spectroscopy Laboratory,1994,11(5):3-6. |
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| Authors: | Guo Zhiqin Chen Yinsxiang |
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| Abstract: | In this paper, depth profiles of the reaction layer of calcium sulphate ore treated with different concentraction aqueous (NaPO3)6 solutions havebeen investigated by XPS. The results indicate that the reaction layer is located in the range of 0-10. 0nm from the surface of ore,the component isabout the same throughout the reaction layer and the difference in atom percentage of P/S is small at the range of 4. 0-7. 0nm. |
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| Keywords: | X-Ray Electronspectroscopy Profile Film |
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