Optical measurement of instantaneous liquid film thickness based on total internal reflection

An optical method of measuring the instantaneous transparent liquid film thickness, based on the effect of total internal reflection by the gas-liquid interface, is represented. A light circle whose diameter is proportional to the liquid film thickness and eccentricity is proportional to the slope gradient of the liquid film surface in the measurement region is formed around a small-size light source in the plane of vessel bottom. Using several light sources, the method allows measurement of the liquid film thickness field. The method is implemented in a multichannel meter of transparent liquid film thickness and curvature surface, with computer image processing.