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Studies on the effect of nozzle-to-substrate distance on the structural, electrical and optical properties of spray deposited CdIn2O4 thin films |
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| Authors: | R.J. Deokate G.L. Agawane J.H. Kim |
| Affiliation: | a Electrochemical Materials Laboratory, Department of Physics, Shivaji University, Kolhapur 416004, Maharashtra, India b Department of Materials Science and Engineering, Chonnam National University, 300 Yongbong-Dong, Puk-Gu, Gwangju 500-757, South Korea c Thin Film Laboratory, Department of Physics and Electronics, Gopal Krishna Gokhale, College, Kolhapur 416012, M.S., India |
| Abstract: | The physical, chemical, electrical and optical properties of as-deposited and annealed CdIn2O4 thin films deposited using spray pyrolysis technique at different nozzle-to-substrate distances are reported. These films are characterized by X-ray diffraction, XPS, SEM, PL, Hall effect measurement techniques and optical absorption studies. The average film thickness lies within 600-800 nm range. The X-ray diffraction study shows that films exhibit cubic structure with orientation along (3 1 1) plane. The XPS study reveals that CdIn2O4 films are oxygen deficient. Room temperature PL indicates the presence of green shift with oxygen vacancies. The typical films show very smooth morphology. The best films deposited with optimum nozzle-to-substrate distance (NSD) of 30 cm, has minimum resistivity of 1.3 × 10−3 Ω cm and 2.6 × 10−4 Ω−1 figure of merit. The band gap energy varies from 3.04 to 3.2 eV with change in NSD for annealed films. The effect of NSD as well as the annealing treatment resulted into the improvement of the structural, electrical and optical properties of the studied CdIn2O4 thin films. |
| Keywords: | Chemical spray pyrolysis X-ray diffraction XPS and PL measurements Electrical properties Optical absorption |
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