|
|||||
|
|
Application of secondary ion mass spectrometry for analyzing the composition and structure of surface layers of fine materials |
|
| Authors: | V P Ivanov |
| Institution: | (1) Institute of Technical Sciences SASA, Knez Mihajlova 35/IV, 11000 Belgrade, Serbia;(2) Solid State Section, Physics Department, Aristotle University of Thessaloniki, 54124 Thessaloniki, Greece;(3) Institute for Multidisciplinary Research, Kneza Viseslava 1, 11000 Belgrade, Serbia;(4) Faculty of Electrical Engineering, University of Belgrade, Bulevar kralja Aleksandra 73, 11000 Belgrade, Serbia |
| Abstract: | Fundamental and methodological aspects of secondary ion mass spectrometry applied to analysis of elemental/phase composition and structure of the surface layers of fine materials are discussed. |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ | |