Improved computer algorithm for characterizing skewed chromatographic band broadening : II. Results and comparisons |
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Authors: | W W Yau S W Rementer J M Boyajian J J DeStefano J F Graff K B Lim J J Kirkland |
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Institution: | E.L DuPont de Nemours & Company, Central Research and Development, Experimental Station, P.O. Box 80228, Wilmington, DE 19880-0228 USA |
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Abstract: | A newly developed method using an exponentially modified Gaussian peak shape model produces results that are more precise and less subject to baseline noise than previous methods for characterizing chromatographic band broadening. The method requires only precisely measurable experimental peak parameters: peak retention time, peak height, peak area, and peak centroid (first moment). Accuracy and precision of the new method were compared with other digital approaches by using computer-synthesized peaks and experimental chromatographic data from many HPLC columns. The proposed method offers a reasonable compromise between accuracy, precision, and convenience. A rapid visual estimate of peak skew can be made by inspecting peak shape and referring to a calibration plot involving peak parameters. Peak variance and skew data from this method are also useful for finding column dispersion corrections in size-exclusion chromatography calibrations. |
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