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| 实验室EXAFS测量中单色器晶体二级衍射的应用 | |
| 引用本文： | 王文采,杨春来,陈玉. 实验室EXAFS测量中单色器晶体二级衍射的应用[J]. 物理学报, 1990, 39(10): 1684-1690 |
| 作者姓名： | 王文采 杨春来 陈玉 |
| 作者单位： | 北京大学物理系,北京,100871 |
| 基金项目： | 国家自然科学基金资助的课题 |
| 摘 要： | 本文研究了实验室EXAFS测量中,应用单色器晶体二级衍射的有关问题,当测定的能量范围内,X射线连续谱上存在杂质发射线时,将导致测定吸收谱精细结构的畸变,研究了对这种谱线畸变进行修正的方法,并对采用晶面二级衍射测定时,EXAFS谱振幅降低的情况下如何求得正确的结构参数进行了讨论。关键词： |
| 关 键 词： | EXAFS 单色器 晶体 衍射 吸收谱 |
| 收稿时间： | 1989-12-04 |
THE APPLICATION OF SECOND ORDER DIFFRACTION OF A MONOCHROMETER IN LABORATORY EXAFS MEASUREMENT |
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| WANG WEN-CAI,YANG CHUN-LAI and CHEN YU. THE APPLICATION OF SECOND ORDER DIFFRACTION OF A MONOCHROMETER IN LABORATORY EXAFS MEASUREMENT[J]. Acta Physica Sinica, 1990, 39(10): 1684-1690 | |
| Authors: | WANG WEN-CAI YANG CHUN-LAI CHEN YU |
| Abstract: | Some aspects on the application of second order diffraction of a monochrometer in laboratory EXAFS measurement are studied. Significant distortions in measured X-ray absorption fine structure occur when there are impurities' emission lines on the continuum spectra m the investigated energy range. A method for correcting that distortion is proposed. As the EXAFS amplitude decreases, which is caused by the application of second order diffraction of a monochrometer, how to obtain correct structural parameters is also discussed. |
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