Fabrication of high quality plan-view TEM specimens using the focused ion beam |
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| Institution: | 1. Department of Materials Science and Engineering, Technion – Israel Institute of Technology, 32000 Haifa, Israel;2. Karlsruhe Institute of Technology, Institute of Nanotechnology, Eggenstein-Leopoldshafen, Germany;3. National University of Science and Technology MISIS, Moscow, Russia;4. Institute of Solid State Physics, Scientific Center in Chernogolovka, Russian Academy of Sciences, Chernogolovka, Russia;1. Department Physical Metallurgy and Materials Testing, Montanuniversität Leoben, Franz-Josef-Straße 18, 8700 Leoben, Austria;2. KAI, Kompetenzzentrum Automobil- und Industrie-Elektronik GmbH, Europastraße 8, 9524 Villach, Austria |
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| Abstract: | We describe a technique using a focused ion beam instrument to fabricate high quality plan-view specimens for transmission electron microscopy studies. The technique is simple, site-specific and is capable of fabricating multiple large, >100 μm2 electron transparent windows within epitaxially grown thin films. A film of La0.67Sr0.33MnO3 is used to demonstrate the technique and its structural and functional properties are surveyed by high resolution imaging, electron spectroscopy, atomic force microscopy and Lorentz electron microscopy. The window is demonstrated to have good thickness uniformity and a low defect density that does not impair the film's Curie temperature. The technique will enable the study of in-plane structural and functional properties of a variety of epitaxial thin film systems. |
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| Keywords: | FIB Plan-view TEM AFM Epitaxial |
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