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Sensitivity of imaging properties of metal-dielectric layered flat lens to fabrication inaccuracies |
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| Authors: | R. Kotyński H. Baghdasaryan T. Stefaniuk A. Pastuszczak M. Marciniak A. Lavrinenko K. Panajotov T. Szoplik |
| Affiliation: | 1.Faculty of Physics,University of Warsaw,Warsaw,Poland;2.Fiber Optics Communication Laboratory,State Engineering University of Armenia,Yerevan,Armenia;3.National Institute of Telecommunications,Warsaw,Poland;4.Department of Photonics Engineering,Technical University of Denmark,Kgs. Lyngby,Denmark;5.Department of Applied Physics and Photonics Vrije Universiteit Brussel, (IR-TONA),Brussels,Belgium;6.Institute of Solid State Physics,Bulgarian Academy of Sciences,Sofia,Bulgaria |
| Abstract: | We characterize the sensitivity of imaging properties of a layered silver-TiO2 flat lens to fabrication inaccuracies. The lens is designed for approximately diffraction-free imaging with subwavelength resolution at distances in the order of a wavelength. Its operation may be attributed to self-collimation with a secondary role of Fabry-Perot resonant transmission, even though the first order effective medium description of the structure is inaccurate. Super-resolution is maintained for a broad range of overall thicknesses and the total thickness of the multilayer is limited by absorption. The tolerance analysis indicates that the resolution and transmission efficiency are highly sensitive to small changes of layer thicknesses. |
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