Electron screening in backward elastic scattering |
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Authors: | F Schümann S Zavatarelli L Gialanella U Greife M Junker D Rogalla C Rolfs F Strieder HP Trautvetter |
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Institution: | Institut für Physik mit Ionenstrahlen, Ruhr-Universit?t, Bochum, Universit?tsstr. 150, D-44780 Bochum, Germany, DE Dipartimento di Fisica, Università di Genova and INFN, Via Dolecaneso, I-16146 Genova, Italy, IT
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Abstract: | Abstact: The elastic scattering cross sections, σ (E,θ), for the systems He+Ta and He+W have been measured at θlab=165° and E
lab=76.1 keV to 3.988 MeV using targets with a thickness of a few atomic layers. The results are smaller than the results given
by the Rutherford scattering law, σR(E,θ), due to the effects of electron screening and can be described by σ(E,θ)/σR(E,θ)=(1+Ue/E)−1, where U
e is an atomic screening potential energy. The deduced average value, U
e=28 ± 3 keV, is consistent with the Moliére- and Lenz-Jensen-models as well as electron binding energies.
Received: 25 May 1998 |
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Keywords: | PACS:25 60 Bx Elastic scattering |
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