Direct observation of Ge and Si ordering at the Si/B/GexSi1-x(111) interface by anomalous x-ray diffraction期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

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Direct observation of Ge and Si ordering at the Si/B/GexSi1-x(111) interface by anomalous x-ray diffraction

Authors:	Tweet Akimoto Tatsumi Hirosawa Mizuki Matsui

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