Measurement of Flexo-coefficients for Nematic LCs without the Influence of the Impurity Ions by Using the Chromatographic Isolation Method |
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| Authors: | Taiju Takahashi Shusuke Nakamura Yukihiro Kudoh |
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| Institution: | 1. Department of Electrical Engineering and Electronics, Kogakuin University, Tokyo, Japanct12326@ns.kogakuin.ac.jp;3. Department of Electrical Engineering and Electronics, Kogakuin University, Tokyo, Japan |
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| Abstract: | The sum of the flexo-coefficients (e11+e33) was measured by the capacitance characteristic depending on the applied dc voltage in the HAN cell. The voltage for the minimum value of the capacitance was shifted by the influence of flexoelectric effect. One of the important problems for the evaluation for the flexo effect was the influence of impurity ions. Then, the chromatographic isolation phenomenon was used to separate impurity ions when the LC material was injected into the empty cell by the capillary action. The coefficient (e11+e33) of ZLI-4792 was measured, and a value of 26.0 pC/m was obtained. |
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| Keywords: | flexoelectric flexo-coefficients HAN cell impurity ions Chromatographic Isolation |
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