Mechanism of charge transfer in <Emphasis Type="Italic">n</Emphasis>-CdS/<Emphasis Type="Italic">p</Emphasis>-CdTe heterojunctions

The capacitance-voltage and current-voltage characteristics of the n-CdS/p-CdTe heterosystem are investigated. Analysis of these characteristics demonstrates that the CdTe_1?x S _x solid solution formed at the n-CdS/p-CdTe heterointerface is inhomogeneous in both the conductivity and composition. The thickness of solid solutions is estimated from the capacitance-voltage characteristics. It is shown that, for the n-CdS/p-CdTe heterosystem, the current-voltage characteristic in the current density range 10^?8-10^?5 A cm^?2 is governed by the thermal electron emission, whereas the current in the heterostructure at current densities in the range 10^?4-10^?2 A cm^?2 is limited by recombination of charge carriers in the electroneutral region of the CdTe_1?x S _x solid solution. The lifetime and the diffusion length of minority charge carriers in the CdTe_1?x S _x solid solution and the surface recombination rate at the interface between the CdS layer and the CdTe_1?x S _x solid solution are determined. It is demonstrated that the n-CdS/p-CdTe heterostructure operates as a p-i-n structure in which CdTe is a p layer, CdTe_1?x S _x is an i layer, and CdS is an n layer.