Abstract: | Crack‐free (100–x) SiO2–x SnO2 glass‐ceramic monoliths have been prepared by the sol–gel method obtaining for the first time SnO2 concentrations of 20% with annealing at 1100 °C. Heat‐treatment resulted in the formation and growth of SnO2 nanocrystals within the silica matrices. Combined use of Fourier transform–Raman spectroscopy and in situ high‐temperature X‐Ray diffraction shows that SnO2 particles begin to crystallize in the cassiterite‐type phase at 80 °C and that their average apparent size remains around 7 nm, even after annealing at 1100 °C. Nanocrystal sizes and size distributions determined by low‐wavenumber Raman are in good agreement with those obtained from transmission electron microscopy measurements. Results indicate that the formation and the growth of SnO2 nanocrystals impose a residual porosity in the silica matrix. Copyright © 2011 John Wiley & Sons, Ltd. |