The structure of SiO2-GeO2 glasses: A spectroscopic study

Four glasses of the SiO₂-GeO₂ binary system have been synthesized via a sol-gel route followed by a heat treatment and a quench. Glass structure has been determined by Ge K-edge X-ray absorption spectroscopy (XAS) at low temperature and Raman spectroscopy. These mixed glasses present a continuous random network of interconnected GeO₄ and SiO₄ tetrahedra, with GeO₄ tetrahedra similar to the GeO₄ units in GeO₂ glass and continuous compositional variations from GeO₂-rich regions to SiO₂-rich regions. Such a random mixture is consistent with physical properties of these binary glasses as well as with the chemical dependence of their polyamorphism at high pressure. This EXAFS-derived mean Ge-O-Si angles are close to the Ge-O-Ge mean angle in GeO₂ glass, 134° and 130°, respectively. This misfit with the Si-O-Si angles might explain the ease of formation of isolated and pair defects centers, which are suspected to be at the origin of photo-induced modifications of optical properties in Ge-bearing SiO₂ glasses.