Quantitative determination of contact stiffness using atomic force acoustic microscopy |
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Authors: | Rabe Amelio Kester Scherer Hirsekorn Arnold |
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Institution: | Fraunhofer Institute for Nondestructive Testing (IZFP), Saarbrucken, Germany. rabe@izfp.fhg.de |
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Abstract: | Atomic force acoustic microscopy is a near-field technique which combines the ability of ultrasonics to image elastic properties with the high lateral resolution of scanning probe microscopes. We present a technique to measure the contact stiffness and the Young's modulus of sample surfaces quantitatively, with a resolution of approximately 20 nm, exploiting the contact resonance frequencies of standard cantilevers used in atomic force microscopy. The Young's modulus of nanocrystalline ferrite films has been measured as a function of oxidation temperature. Furthermore, images showing the domain structure of piezoelectric lead zirconate titanate ceramics have been taken. |
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