首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Uniqueness of Warped Product Einstein Metrics and Applications
Authors:Chenxu He  Peter Petersen  William Wylie
Institution:1. Department of Math, Lehigh University, 14 E. Packer Ave, Christmas-Saucon Hall, Bethlehem, PA, 18015, USA
2. Department of Math, University of Oklahoma, Norman, OK, 73019, USA
3. Department of Math, UCLA, 520 Portola Plaza, Los Angeles, CA, 90095, USA
4. Department of Math, Syracuse University, 215 Carnegie Building, Syracuse, NY, 13244, USA
Abstract:
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号