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Application of IR ellipsometry to determination of the film thickness of a polytetrafluoroethylene sample modified in direct-current discharge |
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| Authors: | M. O. Makeev Yu. A. Ivanov S. A. Meshkov A. B. Gil’man M. Yu. Yablokov |
| Affiliation: | 1.Bauman State Technical University,Moscow,Russia;2.Enikolopov Institute of Synthetic Polymer Materials,Russian Academy of Sciences,Moscow,Russia |
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