首页 | 本学科首页   官方微博 | 高级检索  
     

X射线荧光层析成像中消除散射光的方法
引用本文:谢红兰,高鸿奕,陈建文,陆培祥,徐至展. X射线荧光层析成像中消除散射光的方法[J]. 光学学报, 2003, 23(4): 85-389
作者姓名:谢红兰  高鸿奕  陈建文  陆培祥  徐至展
作者单位:中国科学院上海光学精密机械研究所,上海,201800;中国科学院上海光学精密机械研究所,上海,201800;中国科学院上海光学精密机械研究所,上海,201800;中国科学院上海光学精密机械研究所,上海,201800;中国科学院上海光学精密机械研究所,上海,201800
基金项目:国家 973项目,国家自然科学基金 ( 6 0 2 780 30 )资助课题。
摘    要:介绍了X射线荧光层析成像技术的成像原理及其在微量分析领域中的应用。针对X射线与物质相互作用时,不仅产生荧光,而且会产生各种散射光,为消除这些散射光对成像结果的影响,提出采用在与入射X射线垂直方向放置一个圆环状的晶体单色器,即双聚焦模式晶体单色器,使荧光与各种散射光分离,并聚焦在探测器上。这样不仅大大增强了荧光信号的强度,而且可使荧光探测器小型化。

关 键 词:X射线光学  X射线荧光层析  晶体单色器  同步辐射
收稿时间:2002-04-09

A Method of Eliminating Scattered Light in X-Ray Fluorescent Tomography
Xie Honglan Gao Hongyi Chen Jianwen Lu Peixiang Xu Zhizhan. A Method of Eliminating Scattered Light in X-Ray Fluorescent Tomography[J]. Acta Optica Sinica, 2003, 23(4): 85-389
Authors:Xie Honglan Gao Hongyi Chen Jianwen Lu Peixiang Xu Zhizhan
Abstract:The imaging principle of X-ray fluorescent tomography and its application in microanalysis field are introduced simply . Not only fluorescence but also various scattered light are produced while high energy X rays interact with substance. In order to eliminate the influence of these scattered light to imaging result, a method is proposed in which a doubly focusing crystal monochromator is placed normal to the accident X rays to separate X-ray fluorescence from the background and focuse it to a point on the detector surface. The method not only enhances the intensity of X-ray fluorescence but also permits the use of a smaller detector.
Keywords:X-ray optics  X-ray fluorescent tomography  crystal monochromator  synchrotron radiation
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号