| 次条纹积分干涉计量 |
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| 引用本文： | 干鸣,戚小平.次条纹积分干涉计量[J].光学学报,1995,15(12):613-1616. |
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| 作者姓名： | 干鸣 戚小平 |
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| 作者单位： | 南昌大学基础部 |
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| 基金项目： | 国家教委留学回国科研基金 |
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| 摘 要： | 叙述了次条纹积分干涉干时的原理，仅用一幅光载频干涉纹图获取全部位相信息。先用分段积分法求出条纹初始位相，再由最小二乘原理，迭代出信息的位相解。并讨论了条纹位相的算法，误差修正和测量面形的应用。
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| 关 键 词： | 位相测量 次条纹积分 干涉仪 |
| 收稿时间： | 1995/2/1 |
Subfringe Integration Interferometry |
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| Wang Ming, Qi Xiaoping, Zou Chunhua.Subfringe Integration Interferometry[J].Acta Optica Sinica,1995,15(12):613-1616. |
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| Authors: | Wang Ming Qi Xiaoping Zou Chunhua |
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| Abstract: | We describe a subfringe integration interferometry for which the phase information is evaluated only from one interferogram. The initial phases are obtained by subfringe integration method, then the precision iteration to estimate the phase can be developed from the principle of least--squares estimation. In addition, the phase--extraction algorithm, error correction and some spplications to the measurement of the surface shape are discussed. |
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| Keywords: | phase measurement subfringe integration interferometer |
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