首页 | 本学科首页   官方微博 | 高级检索  
     


Bismuth-dispersed xerogel-based composite films for trace Pb(II) and Cd(II) voltammetric determination
Authors:Panagiotis A. Dimovasilis  Mamas I. Prodromidis
Affiliation:Laboratory of Analytical Chemistry, Department of Chemistry, University of Ioannina, Ioannina 451 10, Greece
Abstract:We report for the first time the synthesis of bismuth-modified (3-mercaptopropyl) trimethoxysilane (MPTMS) and its application for the determination of lead and cadmium by anodic stripping voltammetry. Xerogels made from bismuth-modified MPTMS and mixtures of it with tetraethoxysilane, under basic conditions (NH3·H2O), were characterized with scanning electron microscopy, energy dispersive spectroscopy, infrared spectroscopy and electrochemical methods. Bismuth-modified xerogels were mixed with 1.5% (v/v) Nafion in ethanol and applied on glassy carbon electrodes. During the electrolytic reductive deposition step, the bismuth compound on the electrode surface was reduced to metallic bismuth. The target metal cations were simultaneously reduced to the respective metals and were preconcentrated on the electrode surface by forming an alloy with bismuth. Then, an anodic voltammetric scan was applied in which the metals were oxidized and stripped back into the solution; the voltammogram was recorded and the stripping peak heights were related to the concentration of Cd(II) and Pb(II) ions in the sample. Various key parameters were investigated in detail and optimized. The effect of potential interferences was also examined. Under optimum conditions and for preconcentration period of 4 min, the 3σ limit of detection was 1.3 μg L−1 for Pb(II) and 0.37 μg L−1 for Cd(II), while the reproducibility of the method was 4.2% for lead (n = 5, 10.36 μg L−1 Pb(II)) and 3.9% for cadmium (n = 5, 5.62 μg L−1 Cd(II)). Finally, the sensors were applied to the determination of Cd(II) and Pb(II) ions in water samples.
Keywords:Bismuth-modified xerogel   Bismuth precursors   Determination of Cd(II) and Pb(II) ions   Stripping voltammetry
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号