首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Isotope pattern deconvolution-tandem mass spectrometry for the determination and confirmation of diclofenac in wastewaters
Authors:Ángel Castillo  Emma Gracia-Lor  Antoni Francesc Roig-Navarro  Juan Vicente Sancho  Pablo Rodríguez-González  J Ignacio García Alonso
Institution:1. Research Institute for Pesticides and Water, Universitat Jaume I, E-12071, Castelló, Spain;2. University of Oviedo, Faculty of Chemistry, Department of Physical and Analytical Chemistry, Julián Clavería 8, 33006 Oviedo, Spain
Abstract:Isotope dilution mass spectrometry (IDMS) based on isotope pattern deconvolution (IPD) has been applied here to MS/MS (QqQ) in order to carry out the quantification and confirmation of organic compounds in complex matrix water samples without the use of a methodological IDMS calibration graph. In this alternative approach, the isotope composition of the spiked sample is measured after fragmentation by SRM and deconvoluted into its constituting components (molar fractions of natural abundance and labeled compound) by multiple linear regression (IPD). The procedure has been evaluated for the determination of the pharmaceutical diclofenac in effluent and influent urban wastewaters and fortified surface waters by UHPLC (ESI) MS/MS using diclofenac-d4 as labeled compound. Calculations were performed acquiring a part and the whole fragment cluster ion, achieving in all cases recoveries within 90–110% and coefficients of variation below 5% for all water samples tested. In addition, potential false negatives arising from the presence of diclofenac-d2 impurities in the labeled compound were avoided when the proposed approach was used instead of the most usual IDMS calibration procedure. The number of SRM transitions measured was minimized to three to make possible the application of this alternative technique in routine multi-residue analysis.
Keywords:Isotope pattern deconvolution  Tandem mass spectrometry  Isotope dilution mass  Spectrometry  Diclofenac
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号