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Effect of oxidation dynamics on the film characteristics of Ce:YIG thin films deposited by pulsed-laser deposition
Authors:Yoshiki Nakata  Tatsuo Okada  Mitsuo Maeda  Sadao Higuchi  Kiyotaka Ueda
Institution:aGraduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Fukuoka 812-8581, Japan;bCentral Research Institute of Electric Power Industry, 2-11-1 Iwadokita, Komae, Tokyo 201-8511, Japan
Abstract:Thin films with different compositions of Ce-substituted yttrium iron garnet (Ce:YIG (Y2CeFe5O12)), Ga-doped Ce:YIG (Ce:Ga:YIG (Y2CeFe4.25Ga0.75O12)), and Gd-doped Ce:YIG (Ce:Gd:YIG (Y1.6CeGd0.4Fe5O12)) were deposited on gadolinium gallium garnet (GGG (Gd3Ga5O12)) substrates in O2 or Ar background gas by pulsed-laser deposition (PLD) technique. Crystalline films were obtained at a lower O2 gas pressure of 20 mTorr or at higher Ar gas pressures of more than 100 mTorr. In addition, the behavior of YO molecules was visualized by two-dimensional laser-induced fluorescence (2D-LIF), in order to investigate the oxidation dynamics in the ablation plume. The oxidation dynamics and the crystallinity had close correlation.
Keywords:Cerium substituted yttrium iron garnet  Pulsed-laser deposition  X-ray diffraction analysis  Two-dimensional laser-induced fluorescence
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