Depth Profiling (ICP-MS) Study of Trace Metal ‘Grains’ in Solid Asphaltenes
引用本文:
Pillay AE,Bassioni G,Stephen S,Kühn FE.Depth Profiling (ICP-MS) Study of Trace Metal ‘Grains’ in Solid Asphaltenes[J].Journal of The American Society for Mass Spectrometry,2011,22(8):1403-1408.