| 不同盖层对InAs/GaAs量子点结构和光学性质的影响 |
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| 引用本文： | 田芃,黄黎蓉,费淑萍,余奕,潘彬,徐巍,黄德修.不同盖层对InAs/GaAs量子点结构和光学性质的影响[J].物理学报,2010,59(8):5738-5742. |
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| 作者姓名： | 田芃 黄黎蓉 费淑萍 余奕 潘彬 徐巍 黄德修 |
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| 作者单位： | 华中科技大学武汉光电国家实验室,光电子科学与工程学院,武汉 430074 |
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| 基金项目： | 国家高技术研究发展计划(批准号: 2007AA03Z414), 国家自然科学基金(批准号: 60777019)资助的课题. |
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| 摘 要： | 利用金属有机化合物气相沉积设备生长了不同盖层结构的InAs/GaAs量子点,采用原子力显微镜和光致发光光谱仪对量子点的结构和光学性质进行了研究.量子点层之间的盖层由一个低温层和一个高温层组成.对不同材料结构的低温盖层的对比研究表明,In组分渐变的InGaAs低温盖层有利于改善量子点均匀性、减少结合岛数目、提高光致发光强度;当组分渐变InGaAs低温盖层厚度由6.8 nm增加到12 nm,发光波长从1256.0 nm红移到1314.4 nm.另外,还对不同材料结构的高温盖层进行了对比分析,发现高温盖层采用In组分渐变的InGaAs材料有利于光致发光谱强度的提高.
关键词：
半导体量子点
盖层
组分渐变
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| 关 键 词： | 半导体量子点 盖层 组分渐变 |
| 收稿时间： | 2009-11-03 |
Effect of different cap layers on the structure and optical properties of InAs/GaAs self-assembled quantum dot |
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| Tian Peng,Huang Li-Rong,Fei Shu-Ping,Yu Yi,Pan Bin,Xu Wei,Huang De-Xiu.Effect of different cap layers on the structure and optical properties of InAs/GaAs self-assembled quantum dot[J].Acta Physica Sinica,2010,59(8):5738-5742. |
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| Authors: | Tian Peng Huang Li-Rong Fei Shu-Ping Yu Yi Pan Bin Xu Wei Huang De-Xiu |
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| Institution: | Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China;Wuhan National Laboratory for Optoelectronics,College of Optoelectronic Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,China |
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| Abstract: | Self-assembled InAs/GaAs quantum dot structures with different cap layers are grown by metal-organic chemical vapor deposition.The structure and optical properties of quantum dots are investigated using atomic force microscopy and photoluminescence.The cap layers sandwiched between quantum dots are composed of a low-temperature layer and a high-temperature layer.The comparative studies on low-temperature cap layer show that In graded InGaAs layer structure improves the uniformity of quantum dots,decreases coalescent islands and enhances photoluminescence intensity.Emission wavelength shifts from 1256.0 nm to 1314.4 nm when the thickness of graded InGaAs low-temperature cap layer increases form 6.8 nm to 12 nm.The research on high-temperature cap layer structure indicates that In graded InGaAs layer can increase photoluminescence intensity. |
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| Keywords: | semiconductor quantum dots cap layer graded composition |
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