Development of system and technology for m?ssbauer spectroscopic microscope |
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| Authors: | Kazuo Hayakawa Yuki Akiyama Yoshinori Tsukamoto Mikio Kurata Kenichi Yukihira Hiroyoshi Soejima Yutaka Yoshida |
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| Institution: | 1. Shizuoka Institute of Science and Technology, Toyosawa 2200-2, Fukuroi-city, Shizuoka 437-8555, Japan
2. Shimadzu Corporation, Nishinokyo-Kuwabaracho 1, Nakagyou-ku, Kyoto 604-8511, Japan
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| Abstract: | We have been developing a “M?ssbauer Spectroscopic Microscope (MSM)” which consists of a focusing lens for 14.4?keV γ-rays and a high precision X–Y stage. The measuring system both for electrons and γ-rays combined with a new M?ssbauer driver, i.e., “a moving coil actuator with a liner encoder” enables us to measure the mapping images simultaneously corresponding to different spectral components. The system has a controlling system based on a LabVIEW program and a LIST mode data acquisition system (NIKI-GLASS/A3100). To investigate a correlation between the microstructure of a sample and 57Fe atoms, a scanning electron microscope (APCO/Mini-EOC) is also installed to this system. |
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